Enhanced Reports
In addition to the formats known from Tessy V2.1, test reports can now be created in word format, in HTML format with floating navigation menu and in EXCEL format. The HTML and EXCEL batch reports provide further details about C1 coverage and number of failed/passed test cases for each test object.

Testing the User's Unchanged Binary
Using Hitex' in-circuit emulators, the original application can now be used for unit testing. A C function is tested at its original memory location. To accomplish this, Tessy automatically generates HiSCRIPT commands to control the in-circuit emulator during test execution.

Advanced Stub Functions
An enhancement to stub functions enables the user to provide values for the parameters and the return value of a stub. The user specifies theses values in the Test Data Editor, where required different values for each test case. Tessy automatically checks if the stub is called by the test object with the specified values, if not, the test fails. Tessy provides the specified return value for further processing by the test object. This reveals if the test object handles the return value correctly.

Scripting Support for Emulators
Using the Usercode Editor of Tessy, HiSCRIPT commands can be executed at various points in time during the execution of the user application. This is valuable for setting up memory areas or test object variables and controlling the in-circuit emulator for any other purpose.

Additional Microcontroller Architectures and Compilers Supported
Tessy V2.2 supports ARM, Fujitsu FFMC16, Infineon Tricore/C167, Mitsubishi M16C, Motorola PowerPC / 68k / HC12/08, National CR16C, NEC V850 and 8051 derivatives from various manufacturers.

Tessy supports compilers and debuggers from ARM, Cosmic, Fujitsu, Green Hills, IAR, Keil, Metrowerks, Microtec, National Semiconductors, Tasking, Wind River.