- Press Releases
- Events
- Articles
- Newsletter
Press Releases
Tuesday 02. February 2010
Unit test tool allows temporal component testing
The latest version of Tessy, a tool to automate unit / module / integration testing of embedded software, features “temporal component testing” as major enhancement.
Thursday 21. January 2010
Hitex developed a self-test software library for NXP’s Cortex-M3 based LPC1000 family
Hitex Development Tools has successfully processed a service project for NXP Semiconductors to meet the IEC 60335 standard for automatic electronic controls.
Tuesday 15. December 2009
STM32-comStick now with examples for RTOS and Ethernet
Real-time operating systems can now easily be evaluated with the STM32-comStick by new comprehensive examples provided by Hitex.
Friday 11. December 2009
Debug support for Toshiba’s TMPM370
Hitex has adapted its tool chain to support Toshiba’s TMPM370 microcontroller series designed for use in high-efficiency AC motor applications such as washing machines, refrigerators and air conditioners.
Monday 26. October 2009
Development kit for STM32 Connectivity Line
Hitex introduces the STM32-comStick designed for an easy and low-cost start in STMicroelectronics’ new Cortex-M3-based STM32 Connectivity Line. The STM32-comStick is a complete small-sized development kit that provides a...



