Embedded Knowledge

New article from Frank Büchner in ElektronikPraxis 18/2021. Read full article here.

Matthias Spranz has been the new Head of Engineering at Hitex in Karlsruhe since September 1, 2021.

Hitex was nominated by Infineon as Preferred Design House (PDH) for the Traveo family.

Read a new article from Frank Büchner on how mutation testing rates the quality of your test cases.

Hitex is the exclusive distributor of Arm Keil Tools in the Netherlands

Frank Büchner wrote an article for the magazin "Elektronik" about how to test case quality without problems.

Do you agree? Roland Bickel, Head of Marketing at Hitex, in an interview with "Elektronik Praxis".

Article about standards and program style. Don't miss the latest publication of Hitex.

Main version 4.3 of TESSY, the tool for automated unit, module and integration testing, has been released.

Article by Frank Büchner. Publication: Electronik automotive 10/2020

Frank Büchner wrote an article for MED engineering. Read it here for free.

Hitex has convinced another renowned German automotive supplier of a company license of the SafeTpack.

Article by Nicolas Nahrstedt in German. Published in Design&Elektronik 7/2020.

Hitex extends its safety portfolio and introduces a new AURIX™ development board for safety applications.

The static source code analysis tool ECLAIR is often used in safety critical projects.

Tasks cannot always be completed automatically by tools. In version TESSY 4.2 is now a new type of test for these cases.

Hitex and ESCRYPT are improving cybersecurity for smart factories

Hitex meets high quality standards and thus guarantees comprehensive and competent advice.

Hitex now offers extensive support for Hardware-in-the-Loop (HIL) testing of AURIX™ based systems.

Hitex adapters for the AURIX™ second generation microcontroller family.

Article by Frank Büchner in German. Publication: PraxisElektronik.

Hitex has once again been awarded as a competent distributor by the chip designer Arm.

Article by Frank Büchner in German. Publication: meditronic-journal 3/2019.

What test case quality means for error detection. Article in Elektronikpraxis 4/2019.