Microcontroller self-test libraries

Microcontroller Self-test Libraries

Why reinvent the wheel? Use field-tested software libraries instead and make sure that the silicon and diagnostic coverage required by your standard are implemented with the lowest effort possible. We can supply and help you with the integration of such libraries into your application. The Libraries are especially designed for projects according to IEC 61508 and ISO 26262. We also have a wealth of experience in the design and implementations of Class B libraries in projects according to IEC 60335 and IEC 60730.

Self-tests on embedded microcontrollers need to be performed during run-time to assure that the microcontroller as central processing unit is always running correctly. Self-test libraries include functions such as fault injection and self-test modes. The fault injection mode allows the application to insert faults and thereby verify the correct functioning of the fault handling. Self-test mechanisms called within self-test mode are used to uncover latent faults.

SafeTpack

Hitex SafeTpack for AURIX™ TC3xx

The Hitex SafeTpack is a safety solution for the AURIX™ Infineon microcontroller family, second generation. It covers most safety use cases for applications according to ASIL A to ASIL D.

SafeTpack for AURIX
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TRAVEO II Selftest Libraries

TRAVEO II Selftest Libraries

For the TRAVEO microcontroller family comprehensive selftest libraries are avialable. These fulfil functional safety goals as specified by AUTOSAR.

Traveo II selftest libraries
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Class B libraries

IEC 60335 Class B Libraries

Homeappliances brought into the European market must comply with the IEC 60335 and IEC 60730 standards. Hitex develops and supplies the required Class B libraries to meet these standards.

Class B libraries for IEC 60335 and IEC 60730
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Safety Library for first generation AURIX

PRO-SIL SafeTlib

The PRO-SIL™ SafeTlib package delivers the required silicon coverage and documentation to back up your safety case applications based on Infineon's first generation AURIX family of devices.

Safety Library for first generation AURIX
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Arm software test libraries

Arm SW test libraries

Arm SW libraries are assembly language routines that are designed to efficiently identify any faults or errors that may be present when Arm-based processors are powered on or during their operation. This ensures that any issues can be detected and addressed promptly, minimizing any potential disruptions to the system.

Arm selftest library details
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