Embedded Knowledge

HIL tests of AURIX

HIL tests of AURIX™ based systems

Hitex now offers extensive support for Hardware-in-the-Loop (HIL) testing of AURIX™ based systems.

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Break-out and trace adapter

Break-out and trace adapter

Hitex adapters for the AURIX™ second generation microcontroller family.

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code coverage

Misconceptions about code coverage

Article by Frank Büchner in German. Publication: PraxisElektronik.

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Sales Management Excellence

"Sales Management Excellence" award

Hitex has once again been awarded as a competent distributor by the chip designer Arm.

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software unit with IEC 62304

Software unit verification in IEC 62304

Article by Frank Büchner in German. Publication: meditronic-journal 3/2019.

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test cases

Are your test cases good enough?

What test case quality means for error detection. Article in Elektronikpraxis 4/2019.

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Safety goals

Safety goals easier to achieve

Article by Björn Assmann, Dr. Kurt Böhringer, David Nicholls in German.

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complexity

What is behind cyclomatic complexity?

Article by Frank Büchner in German. Publication on industr.com

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robust code

How robust is my code?

Technical article by Frank Büchner in German. Publication on elektroniknet

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Standard-compliant verification

Standard-compliant verification

Software for medical technology according to IEC 62304. Article by Frank Büchner in German.

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Cleaning for the code

Sanitize your code!

Article by Frank Büchner in German. Publication on elektroniknet.de

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